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Germany – Scanning electron microscopes – 3D LIT-OBIRCH system (IMWS-2.1) +Scanning Electron Microscope with ultrafast e-beam operation (IMWS-3.1 ) - PR876527-2690-P

Issued by Fraunhofer-Gesellschaft - Einkauf B12
Published on December 8, 2025
DEU

Tender Description

3D LIT-OBIRCH system (IMWS-2.1) +Scanning Electron Microscope with ultrafast e-beam operation (IMWS-3.1 )

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