Netherlands – Scanning electron microscopes – Maintenance contract for the TEM (2 years) and PFIB (4 years)

Multiannual preventive and corrective maintenance contract for the Transmission Electron Microscope (TEM) s/n D 216 (and Plasma Focused Ion Beam (PFIB) Helios 4S, s/n 9952899. The service contract covers a period of two years for the TEM and four years for the PFIB and includes consumables, spare parts and labor. The TEM has a shorter duration due to the lifetime expectation of the instrument.