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Public Tender Opportunity

Germany – Semiconductors – Surface inspection system for defect detection on wafers - PR880078-3220-P

Issued by Fraunhofer-Gesellschaft - Einkauf B12
Published on October 17, 2025
DEU

Tender Description

Surface inspection system for defect detection on wafers

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Germany – Semiconductors – Surface inspection system for defect detection on wafers - PR880078-3220-P | Public Tender | tend.ee